| Autor: |
Li, Hui, Feng, Chunyang, Luo, Jianjun, Ren, Wei, Niu, Huiyuan, Chang, Yingke, Li, Jiao |
| Předmět: |
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| Zdroj: |
AIP Advances; Feb2024, Vol. 14 Issue 2, p1-5, 5p |
| Abstrakt: |
Pyrotechnic device is the key initiating component of weapon system, and its function reliability will directly affect the triggering of detonation and actuation mechanism. In order to enhance the survival ability of pyrotechnic device in intricate electromagnetic interference environment, it is necessary to carry out in-depth research on the electromagnetic protection technique of pyrotechnic device. In this paper, a new electromagnetic protection circuit based on vertical punch through PN junction device is proposed, which monolithically integrates the circuit with polysilicon semiconductor bridge on a single chip. The Electro-static Discharge (ESD) test was carried out according to the method specified by standard electrostatic standard 500 pF/500 Ω/25 kV, and the ESD capability of the proposed new chip was not less than 25 kV. Compared with the electromagnetic protection circuit by transient voltage suppressor diode based on lateral punch through junction device structure, the new chip increases the effective junction area of PN junction, reduces the current density, and increases the current conduction ability and electrostatic roughness of the diode. The new chip has a larger diode effective junction capacitance, which not only improves the ESD capability but also improves the RF protection capability at the same time. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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