Multicrystalline Informatics Applied to Multicrystalline Silicon for Unraveling the Microscopic Root Cause of Dislocation Generation.

Autor: Yamakoshi, Kenta, Ohno, Yutaka, Kutsukake, Kentaro, Kojima, Takuto, Yokoi, Tatsuya, Yoshida, Hideto, Tanaka, Hiroyuki, Liu, Xin, Kudo, Hiroaki, Usami, Noritaka
Zdroj: Advanced Materials; 2/22/2024, Vol. 36 Issue 8, p1-13, 13p
Databáze: Complementary Index
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