Application of Machine Learning Algorithm for Defect Analysis in Semiconductors Using High Resolved Scanning Acoustic Microscopy.
| Autor: | Sukumaran Nair, Arya, Czurratis, Peter, Bogucanin, Denis |
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| Zdroj: | ECS Meeting Abstracts; 2023, Vol. MA2023-02 Issue 1, p1590-1590, 1p |
| Databáze: | Complementary Index |
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