Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium.

Autor:	Liu, Chao, Pan, Jie, Yuan, Qihui, Zhu, Chao, Liu, Jianquan, Ge, Feixiang, Zhu, Jijie, Xie, Haitao, Zhou, Dawei, Zhang, Zicheng, Zhao, Peiyi, Tian, Bobo, Huang, Wei, Wang, Lin
Zdroj:	Advanced Materials; 1/18/2024, Vol. 36 Issue 3, p1-9, 9p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Plný text