Investigation of the defect structure of high-resistance CdTe single crystals by the methods of high-resolution x-ray diffractometry and total integral reflective power.
| Autor: | Fodchuk, I., Kuzmin, A., Dovganyuk, V., Balovsyak, S., Hutsuliak, I., Solodkyi, M., Makotiak, D., Tkach, O. |
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| Zdroj: | Proceedings of SPIE; 6/24/2024, Vol. 12938, p129382G-129382G-6, 1p |
| Databáze: | Complementary Index |
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