Autor: |
Zborowski, C., Vanleenhove, A., Hoflijk, I., Vaesen, I., Artyushkova, K., Conard, T. |
Předmět: |
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Zdroj: |
Surface Science Spectra; Dec2023, Vol. 30 Issue 2, p1-8, 8p |
Abstrakt: |
Indium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of indium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of In 2s, In 2p3/2, In 3s, In 3p3/2, In 3d, In 4s, and In 4d. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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