| Autor: |
Zborowski, C., Hoflijk, I., Vaesen, I., Vanleenhove, A., Artyushkova, K., Conard, T. |
| Předmět: |
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| Zdroj: |
Surface Science Spectra; Dec2023, Vol. 30 Issue 2, p1-7, 7p |
| Abstrakt: |
A bismuth foil was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of bismuth obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Bi 2p3/2, Bi 3d5/2, Bi 4s, Bi 4p3/2, Bi 4d5/2, and Bi 4f. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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