| Autor: |
Mikhailenko, M. S., Pestov, A. E., Zorina, M. V., Chernyshev, A. K., Chkhalo, N. I., Shevchuk, I. E. |
| Zdroj: |
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Dec2023, Vol. 17 Issue 6, p1338-1342, 5p |
| Abstrakt: |
To increase the average and peak power of modern laser systems, a need appears for new materials or the possibility of modifying existing ones to create composites based on them. Such composite materials with the use of optical materials with a high thermal conductivity can serve to remove heat from the active medium. The substrates of X-ray optical elements operating under powerful synchrotron radiation beams should solve the same task. One of the promising materials for these purposes is single-crystal sapphire, since it has a fairly high thermal conductivity (~23–25 W/(m K) at 323 K) and a low temperature coefficient of linear expansion (~10–6 K–1 at Т = 323 K). In this work, the effect of energy and angles of incidence on the sample surface of argon ions on the surface roughness of the a cut of single-crystal sapphire is studied. In the course of the study, the effect of smoothing the surface roughness by 30% relative to the initial value in the spatial frequency range from 0.049 to 63 µm–1 is demonstrated. The possibility of the ion processing of samples is also shown; in particular, at angles of incidence of ions on the sample surface within ±40°, the value of its effective roughness does not change much, which allows local correction of object shape errors without significant changes in the surface quality. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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