Autor: |
Nizovskii, A. I., Shmakov, A. N., Kulikov, A. V., Suprun, E. A., Bukhtiyarov, V. I. |
Zdroj: |
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Dec2023, Vol. 17 Issue 6, p1186-1191, 6p |
Abstrakt: |
Using high-resolution X-ray diffraction and synchrotron radiation, as well as scanning electron microscopy, it is shown that the observed high reactivity of commercial aluminum alloys activated with the Ga–In eutectic is associated with the formation of the Al–Ga–In eutectic along the grain boundaries in the entire material volume. The loss of material activity during storage under atmospheric conditions is due to oxidation of the eutectic components. Activation with pure gallium leads to the formation of AlGax solid solution, which has low activity in the reaction with water under neutral pH. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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