| Autor: |
Schelchshorn, Michael, Stilp, Fabian, Weiss, Marco, Giessibl, Franz J. |
| Předmět: |
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| Zdroj: |
Review of Scientific Instruments; Nov2023, Vol. 94 Issue 11, p1-15, 15p |
| Abstrakt: |
The qPlus sensor allows for the simultaneous operation of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). When operating a combined qPlus sensor STM/AFM at large tunneling currents, a hitherto unexplained tunneling current-induced cross coupling can occur, which has already been observed decades ago. Here, we study this phenomenon both theoretically and experimentally; its origin is voltage drops on the order of μV that lead to an excitation or a damping of the oscillation, depending on the sign of the current. Ideally, the voltage drops would be phase-shifted by π/2 with respect to a proper phase angle for driving and would, thus, not be a problem. However, intrinsic RC components in the current wiring lead to a phase shift that does enable drive or damping. Our theoretical model fully describes the experimental findings, and we also propose a way to prevent current-induced excitation or damping. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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