Advancements in EUV photoresists for high-NA lithography.

Autor: Develioglu, Aysegul, Vockenhuber, Michaela, van Lent-Protasova, Lidia, Mochi, Iacopo, Ekinci, Yasin, Kazazis, Dimitrios
Zdroj: Proceedings of SPIE; 12/19/2023, Vol. 12750, p1275008-1275008, 1p
Databáze: Complementary Index