Autor: |
Al-Saymari, Furat A., Craig, Adam P., Lu, Qi, Hanks, Laura A., Marshall, Andrew R. J., Krier, Anthony |
Předmět: |
|
Zdroj: |
Applied Physics Letters; 11/13/2023, Vol. 123 Issue 20, p1-6, 6p |
Abstrakt: |
We investigated the design, growth, fabrication, and characterization of InAs/GaAsSb SLS resonant cavity light emitting diodes (RCLEDs) grown on InAs by molecular beam epitaxy. The structure consists of a 1λ-thick micro-cavity positioned between two lattice-matched AlAsSb/GaAsSb distributed Bragg reflector mirrors (DBRs). A 44-pair InAs/GaAsSb SLS active region is placed at the antinode of the electric field intensity in the center of the cavity. Electroluminescence emission spectra were recorded at room-temperature. Due to the resonant cavity effect, 400 μm-diameter SLS RCLEDs exhibited emission spectra peaked at 4.587 μm with a narrow spectral linewidth of 52 nm. A high-spectral intensity of >3 mW cm−2 nm−1 was achieved for the 400 μm SLS RCLED using 1% duty cycle to avoid Joule heating. Furthermore, temperature dependence of the emission spectra of the RCLED showed excellent temperature stability, with a rate of 0.34 nm/K. Compared to existing mid-infrared 5-stage InAs/GaAsSb SLS ICLEDs operating at ∼4.5 μm, the (400 μm-diameter) InAs/GaAsSb SLS RCLEDs exhibited 10.5× brighter spectral intensity, 14× narrower spectral linewidth, and 8× improvement in the temperature stability. Owing to these attractive features, our SLS RCLEDs could be used to develop the next generation CO gas instruments and active imaging. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
|