Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach.
| Autor: | Allen, Frances I, Blanchard, Paul T, Lake, Russell, Pappas, David, Xia, Deying, Notte, John A, Zhang, Ruopeng, Minor, Andrew M, Sanford, Norman A |
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| Zdroj: | Microscopy & Microanalysis; Oct2023, Vol. 29 Issue 5, p1628-1638, 11p |
| Databáze: | Complementary Index |
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