Microscopy of Materials Used In the Semiconductor Industry.
| Autor: | Merchant, Sailesh M., DeLucca, John M., Hooghan, Kultaransingh N., Baiocchi, Frank A. |
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| Zdroj: | Microscopy & Microanalysis; 2005 Supplement, Vol. 11, p1326-1327, 2p |
| Databáze: | Complementary Index |
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