Recent Advancements in Nanomechanical Characterization Techniques and Associated Technologies.

Autor: Warren, Oden L., Asif, S. A. Syed, Dwivedi, Arpit, Wei Che, Wyrobek, Thomas J.
Zdroj: Microscopy & Microanalysis; 2005 Supplement, Vol. 11, p370-371, 2p
Databáze: Complementary Index