In situ studies on defect formation dynamics in flash-sintered TiO2.

Autor: Xue, Sichuang, Li Phuah, Xin, Jian, Jie, Li, Qiang, Li, Jin, Yang, Bo, Zhang, Di, Wang, Han, Tsakalakos, Thomas, Mukherjee, Amiya K., Wang, Haiyan, Zhang, Xinghang
Zdroj: Nanoscale; 11/7/2023, Vol. 15 Issue 41, p16752-16765, 14p
Databáze: Complementary Index