Study of the semiconductor materials influence in measuring technology on the measure efficiency in upper layers of the atmosphere.
| Autor: | Udalov, Andrey A., Shesterikov, Evgenii V. |
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| Zdroj: | Proceedings of SPIE; 1/18/2024, Vol. 12780, p127807M-127807M-4, 1p |
| Databáze: | Complementary Index |
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