| Autor: |
Ritz, Christian, Lu, Bin, Theiler, Pius M., Stemmer, Andreas |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 10/14/2023, Vol. 134 Issue 14, p1-11, 11p |
| Abstrakt: |
Photoinduced force microscopy (PiFM) is a technique for nanoscale characterization of optically active materials. For correct data analysis, it is important to understand and recognize potential artifacts. In this study, we provide a Fourier-based framework for the different origins of the photoinduced force, including the photothermal motion of the atomic force microscopy (AFM) tip in PiFM measurements. We use individual gold nanoparticles as a model system to explore such tip-related phenomena and to demonstrate the benefits of three-dimensional analysis of the photoinduced force. Comparison of the in-phase heterodyne PiFM signal and the derivative of the tip–sample interaction, ∂ ⟨ k ts ⟩ / ∂ z c , directly reveals a photothermal origin for the PiFM signal in our experiments. Furthermore, we observe a lateral photothermal vibration of the tip apex induced by tip asymmetry. This lateral vibration emphasizes the importance of considering the motion of the AFM tip during data analysis. The improved lateral resolution conferred by ∂ ⟨ k ts ⟩ / ∂ z c can lead to misinterpretation. Our findings highlight that meticulous data analysis is required to ensure the correct interpretation of PiFM data. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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