CMOS Scaling Challenges for High Performance and Low Power applications facing Reliability Criteria towards the Decananometer range.
| Autor: | Bravaix, A, Hamparsoumian, G, Sonzogni, J, Pitard, H, Garba-Seybou, T, Kussener, E, Federspiel, X, Cacho, F |
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| Zdroj: | Journal of Physics: Conference Series; Jul2023, Vol. 2548 Issue 1, pN.PAG-N.PAG, 1p |
| Databáze: | Complementary Index |
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