Understanding the impact of rinse on SEM image distortion and hole patterning variability.

Autor: Soltani, Elvire, Le-Gratiet, Bertrand, Bérard-Bergery, Sébastien, Pradelles, Jonathan, Bourguignon, Thibaut, Le Pennec, Aurélie, Charras, Nathalie, Tiron, Raluca
Zdroj: Proceedings of SPIE; 2/9/2024, Vol. 12802, p1280209-1280209, 1p
Databáze: Complementary Index