Curved CMOS imaging sensor: development and reliability test results.

Autor: Joaquina, Kelly, Jahn, Wilfried, Struss, Quentin, Delcroix, Pierre, Renard, Marc, Cornu, Simon, Lemared, Sabri, Mehri, Tahar
Zdroj: Proceedings of SPIE; 1/15/2024, Vol. 12777, p127776S-127776S-10, 1p
Databáze: Complementary Index