Real-time Image Deblurring to Improve Throughput of Serial-Section Volume Electron Microscopy for Neural Connectomic Studies.

Autor: Schalek, R L, Parikh, N, Wu, Y, Lichtman, J W, Wei, D
Zdroj: Microscopy & Microanalysis; 2023 Supplement, p988-989, 2p
Databáze: Complementary Index