Real-time Image Deblurring to Improve Throughput of Serial-Section Volume Electron Microscopy for Neural Connectomic Studies.
Autor: | Schalek, R L, Parikh, N, Wu, Y, Lichtman, J W, Wei, D |
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Zdroj: | Microscopy & Microanalysis; 2023 Supplement, p988-989, 2p |
Databáze: | Complementary Index |
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