Anisotropy and thermal properties in GeTe semiconductor by Raman analysis.

Autor: Yang, Shuai, Sui, Fengrui, Liu, Yucheng, Qi, Ruijuan, Feng, Xiaoyu, Dong, Shangwei, Yang, Pingxiong, Yue, Fangyu
Zdroj: Nanoscale; 8/28/2023, Vol. 15 Issue 32, p13297-13303, 7p
Databáze: Complementary Index