| Autor: |
Rotscholl, Ingo, Liu, Bob, Krüger, Udo |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers; Apr2023 Supplement 1, Vol. 54, p153-156, 4p |
| Abstrakt: |
This paper provides an overview of image stitching and its general advantages and challenges. Further, we introduce a novel stitching concept based on our advanced pixel registration (APR) procedure. It allows easy and comparable flexible stitching setups for DeMURA and uniformity measurements in laboratory and production environments. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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