Gate voltage dependent mobility of oligothiophene field-effect transistors.

Autor: Horowitz, Gilles, Hajlaoui, Riadh
Předmět:
Zdroj: Journal of Applied Physics; 3/15/1999, Vol. 85 Issue 6, p3202, 5p, 1 Diagram, 2 Charts, 4 Graphs
Abstrakt: Offers information on a study which examined the systematic study of the gate bias dependence of the field-effect mobility in three oligothiophenes. How the study was conducted; Contact resistance of the transistors; Gate voltage dependent mobility.
Databáze: Complementary Index