| Autor: |
Magee, Charles W., Buyuklimanli, Temel H. |
| Předmět: |
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| Zdroj: |
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2023, Vol. 41 Issue 4, p1-2, 2p |
| Abstrakt: |
Erratum: "Secondary ion mass spectrometry quantification: Do you remember when a factor of 2 was good enough?" The error is only in this figure, and discussions and conclusions in the article are unaffected. Error in using the B RSF calculated from a Si standard and the error when using PCOR-SIMSSM vs Ge content. [Extracted from the article] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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