| Autor: |
Alagoz, H. S., Egilmez, M., Jung, J., Chow, K. H. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 6/19/2023, Vol. 122 Issue 25, p1-5, 5p |
| Abstrakt: |
We investigate the electrical and thermal conduction properties of low- (ON) and high-resistance (OFF) states in Pt/NiOx/Pt based unipolar ReRAM devices during cooling and warming cycles between 300 and 180 K. The conduction electron-trap activation energy was found to decrease upon warming. Although thermal cycling did not significantly affect the average resistance-temperature coefficient of the Pt diffused conductive filaments in the system, the ON-state resistance fluctuations increase at high temperatures, indicating that ambient temperature significantly affects the sizes of the formed filaments. The mechanism behind these thermally activated changes is discussed. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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