| Autor: |
Ohno, M., Fujita, T. C., Kawasaki, M. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 6/19/2023, Vol. 122 Issue 25, p1-4, 4p |
| Abstrakt: |
We present an epitaxial stabilization of pyrochlore Bi2Rh2O7 on the Y-stabilized ZrO2 (YSZ) (111) substrate by inserting a pyrochlore Eu2Ti2O7 template layer, otherwise Bi-based layered structures being formed directly on the YSZ (111) substrate. This result reveals that "iso-structural crystal phase" plays an important role in the interfacial phase control. The Bi2Rh2O7 film exhibits p-type electrical conduction with the lowest longitudinal resistivity ( ρ xx ) among the reported Rh pyrochlore oxides. Such parameters as ρ xx , carrier density, and mobility show almost no temperature dependence in the measured range of 2–300 K. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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