| Autor: |
Molodkin, V. B., Storizhko, V. Yu., Kladko, V. P., Lizunov, V. V., Nizkova, A. I., Gudimenko, A. Yo., Olikhovskii, S. I., Tolmachev, M. G., Dmitriev, S. V., Demchyk, I. I., Bogdanov, E. I., Hinko, B. I. |
| Předmět: |
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| Zdroj: |
Semiconductor Physics, Quantum Electronics & Optoelectronics; 2023, Vol. 26 Issue 1, p17-24, 8p |
| Abstrakt: |
Generalization of the methods for the purposeful influence of the interrelated variations inherent to different experimental conditions on changes in the selectivity of the sensitivity of the azimuthal dependence of the total integrated intensity of dynamical diffraction to various types of defects in single crystals has been carried out. As a result, the improved phase-variation methods with additionally increased sensitivity and informativity of non-destructive structural diagnostics aimed at multi-parametrical single crystal systems have been developed. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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