New functional surface treatment process and primers for high-NA EUV lithography.

Autor: Shibayama, Wataru, Shigaki, Shuhei, Takeda, Satoshi, Kato, Kodai, Nakajima, Makoto, Sakamoto, Rikimaru
Zdroj: Proceedings of SPIE; 4/11/2023, Vol. 12498, p124980O-124980O-10, 1p
Databáze: Complementary Index