Mask errors impact on grayscale lithography patterning.

Autor: Palanchoke, Ujwol, Bélot, Gaby, Bérard-Bergery, Sébastien, Saugnier, Juline, Sungauer, Elodie, Beylier, Charlotte, Tomaso, Florian, Pourteau, Marie-Line, Mendes, Ivanie, Coquand, Rémi, Bernadac, Arthur
Zdroj: Proceedings of SPIE; 4/10/2023, Vol. 12497, p124970N-124970N-17, 1p
Databáze: Complementary Index