Investigation of manufacturing techniques to develop controlled flaws for x-ray computed tomography reliability assessment.
| Autor: | Kim, F. H., Robinson, S. M., Klimov, N. N., Scott, J. H. J. |
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| Zdroj: | Proceedings of SPIE; 4/4/2023, Vol. 12491, p1249108-1249108, 1p |
| Databáze: | Complementary Index |
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