Spectral micro-CT imaging of multiple K-edge elements using GaAs and CdTe photon counting detectors.
| Autor: | Allphin, A. J., Clark, D. P., Thuering, T., Bhandari, Prajwal, Ghaghada, K. B., Badea, C. T. |
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| Zdroj: | Proceedings of SPIE; 3/7/2023, Vol. 12463, p124630T-124630T-7, 1p |
| Databáze: | Complementary Index |
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