Siam-VAE: a hybrid deep learning based anomaly detection framework for automated quality control of head CT scans.
| Autor: | Ghosh, Soumyendu Sekhar, Dhar, Rajat, Marcus, Daniel S., Sotiras, Aristeidis |
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| Zdroj: | Proceedings of SPIE; 3/9/2023, Vol. 12486, p124650X-124650X-7, 1p |
| Databáze: | Complementary Index |
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