Transient interferometric scattering microscopy on nanoscale objects with high sensitivity.
| Autor: | Birkmeier, Konrad, Brodschelm, Andreas, Tauser, Florian, Häring, Reto, Wolfring, Bernhard, Hartschuh, Achim |
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| Zdroj: | Proceedings of SPIE; 1/13/2023, Vol. 12410, p1241009-1241009, 1p |
| Databáze: | Complementary Index |
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