Characterization of Materials Properties by EBSD, EDS and AFM.
| Autor: | Goulden, J., Pinard, P., Gholinia, A., Kocun, M., Proksch, R. |
|---|---|
| Zdroj: | Microscopy & Microanalysis; Aug2019 Supplement, p594-595, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Goulden, J., Pinard, P., Gholinia, A., Kocun, M., Proksch, R. |
|---|---|
| Zdroj: | Microscopy & Microanalysis; Aug2019 Supplement, p594-595, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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