| Autor: |
Takao, Tomoaki, Ito, Toni, Umekawa, Kenji, Fukasawa, Yuta, Tanaka, Hideki, Umeda, Masaichi |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Applied Superconductivity; Jun2004, Vol. 14 Issue 2, p1070-1073, 4p |
| Abstrakt: |
This paper presents degradation of critical currents (Ic) owing to transversal-compressive force to bismuth tapes. We applied the compressive force perpendicular to the Bi-2223 tape surface, and measured dependence of Ic and n-values on the force. Contact configurations of pushing parts to the tape are face and line contacts. According to the experimental results, decreasing of the Ic was large when the damaged area on the compressed tape was small. That is, degradation in the line-contact experiments was larger than that in the face-contact experiments. It was experimentally demonstrated that the Ic degradation due to the transversal-compressive force strongly depended on the length of the damaged segments along the tapes. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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