| Autor: |
Yang, Yang, Dipti, Gall, Amy, O'Neil, Galen, Szypryt, Paul, Hosier, Adam, Foster, Adam, Naing, Aung, Tan, Joseph N., Schultz, David R., Smith, Randall, Brickhouse, Nancy, Ralchenko, Yuri, Takacs, Endre |
| Předmět: |
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| Zdroj: |
Atoms (2218-2004); Mar2023, Vol. 11 Issue 3, p44, 7p |
| Abstrakt: |
In an effort to measure electron-impact ionization (EII) cross-sections of He-like F e 24 + at the electron beam ion trap (EBIT) facility of the National Institute of Standards and Technology (NIST), we have experimentally determined the corrections to the nominal beam energy determined by the voltages applied to the EBIT. High-resolution X-ray spectra were recorded at nominal electron beam energies between 6660 eV and 6750 eV using X-ray microcalorimetry based upon an array of 192 transition-edge sensors (TES). A large-scale collisional-radiative simulation of the non-Maxwellian EBIT plasma using relevant atomic data calculated with Flexible Atomic Code allowed us to determine the space-charge correction due to the electron beam including the neutralization factor by the ion cloud of the EBIT. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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