| Autor: |
Moreau, Raphaël, Brunel-Duverger, Lucile, Pichon, Laurent, Moignard, Brice, Gourier, Didier, Calligaro, Thomas |
| Zdroj: |
European Physical Journal Plus; Jan2023, Vol. 138 Issue 1, p1-9, 9p |
| Abstrakt: |
Photoluminescence (PL) under monochromatic illumination in the UV-Vis-NIR (200–1000 nm), and Reflectance Imaging Spectroscopy (RIS) in the visible and near-infrared domain (NIR, 700–1000 nm) are well-established techniques which usefully complements X-ray fluorescence spectrometry (XRF) in the study of paintworks. PL under UV illumination allows the rapid identification of organic pigments undetected by XRF like dyes and provides clues for distinguishing crystalline phases of inorganic pigments showing the same XRF spectra like hydrocerussite and cerussite in lead white. For example, PL in the NIR domain allows the detection of pigments like Egyptian blue. The new system presented here is an evolution of the versatile MA-XRF previously designed by our group, which now allows the simultaneous recording of the PL, reflectance and XRF spectra on the same spot and delivers intrinsically aligned XRF/PL/RS maps. The five spectral datasets (XRF, PL under 250 nm, 365 nm and 655 nm excitation, RIS in 400–1000 nm) can be exploited for coupled exploration and processing of maps using open-source programs. The operation of this instrument, which is the first to combine XRF, RS and PL mappings, is exemplified on a Fayum portrait from the collection of the Egyptian antiquities Department of the Louvre Museum. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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