Some classes of easily testable circuits in the Zhegalkin basis.

Autor: Borodina, Yulia V.
Zdroj: Discrete Mathematics & Applications; Feb2023, Vol. 33 Issue 1, p1-6, 6p
Abstrakt: We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index