Synthetic c charts with known and estimated process parameters based on median run length and expected median run length.

Autor: Lee, Ming Ha, Khoo, Michael B. C., Haq, Abdul, Wong, Dennis M. L., Chew, XinYing
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Zdroj: Quality Technology & Quantitative Management; Mar2023, Vol. 20 Issue 2, p168-183, 16p
Abstrakt: In statistical process control, the total number of nonconformities per unit of a process is monitored by using the c chart. In this study, the run length performance of the synthetic c chart with known process parameter (denoted as the KP-Syn-c chart) and the synthetic c chart with estimated process parameter (denoted as the EP-Syn-c chart) are evaluated in terms of the median run length (MRL). The results show that the sensitivity of the MRL-based EP-Syn-c chart is dependent on the number of preliminary samples used in the Phase-I analysis. Furthermore, percentiles of the run length distribution are used to provide a better understanding for the run length performance of the EP-Syn-c chart. The numerical analysis shows that the required minimum number of preliminary samples can be very large for the MRL-based EP-Syn-c chart to perform similar as the KP-Syn-c chart. An optimization procedure is suggested to compute the design parameters of the EP-Syn-c chart by minimizing the out-of-control MRL. Furthermore, the optimal design procedure of the EP-Syn-c chart is also provided through minimizing the out-of-control expected MRL for the unknown process shift size. An example is provided to illustrate the design and implementation of the MRL-based EP-Syn-c chart. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index
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