| Autor: |
Kudriashov, Andrei, Babich, Ian, Hovhannisyan, Razmik A., Shishkin, Andrey G., Kozlov, Sergei N., Fedorov, Alexander, Vyalikh, Denis V., Khestanova, Ekaterina, Kupriyanov, Mikhail Yu., Stolyarov, Vasily S. |
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| Zdroj: |
Advanced Functional Materials; Dec2022, Vol. 32 Issue 49, p1-6, 6p |
| Abstrakt: |
Typically, topological superconductivity is reachable via proximity effect by a direct deposition of superconductor (S) on top of a topological insulator (TI) surface. Here, the double critical current in the Josephson junctions based on the topological insulator is observed in the fabricated planar Superconducting Quantum Interference Devicea. By measuring critical currents as a function of temperature and magnetic field, it is shown that the second critical current stems from the intrinsic superconductivity of the S–TI interface, which is supported by the modified Resistively Shunted Junction model and Transmission Electron Microscopy studies. This complex structure of the interface should be taken into account when the technological process involves Ar‐plasma cleaning. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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