Application of Beidou high-precision positioning in high-rise building monitoring.

Autor:	Qian, Jianrong
Zdroj:	Proceedings of SPIE; 11/12/2022, Vol. 12348, p123483G-123483G-7, 1p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu