11.3: Invited Paper: MicroLED End‐to‐End Process Control.
| Autor: | Robinson, John C., Barnett, Bobby |
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| Zdroj: | SID Symposium Digest of Technical Papers; Oct2022 Supplement S1, Vol. 53, p125-128, 4p |
| Abstrakt: | MicroLED displays offer many key performance benefits such as brightness, contrast, and lifetime, however, cost remains a barrier to wide market acceptance. Improved yield through better process control provides a pathway to lower costs. In this paper we discuss yield and end‐to‐end process control from epitaxy and microLED patterning, driver IC (optional), backplane, mass‐transfer, and bonding. [ABSTRACT FROM AUTHOR] |
| Databáze: | Complementary Index |
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