| Autor: |
Silva, Leandro Alves da, Ho, Linda Lee, Quinino, Roberto Costa |
| Předmět: |
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| Zdroj: |
Quality & Reliability Engineering International; Nov2022, Vol. 38 Issue 7, p3342-3356, 15p |
| Abstrakt: |
This paper proposes an attribute control chart named npx(I)μ$np_{x(I)}^{\mu }$ which is used for monitoring the process mean value of a variable (X) by employing sequential sample sizes of na$n_a$, nb$n_b$ with na>nb$n_a> n_b$. Each item is classified as approved or not according to a discriminant limit (wi$w_i$, i=a,b$i=a, b$) using a GO/NO GO gauge. In the end of inspection we'll have Ya$Y_a$ and Yb$Y_b$ items classified as disapproved. Whenever Ya>UCLna$Y_a> UCL_{n_a}$ or Yb>UCLnb$Y_b> UCL_{n_b}$, the process is judged to be out of control and after adjustments in the process, the inspection is always restarted with a sample size of na$n_a$. The parameters used in the construction of the npx(I)μ$np_{x(I)}^{\mu }$ control chart were obtained through a search for values that optimize their performance, such that can compete with the standard attribute npx$np_x$ chart and the traditional X¯$\overline{X}$ control chart. The performances were compared in terms of average run length (ARL$ARL$) in scenarios of shift sizes (δ) in the process mean. A numerical example illustrates its application. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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