SIMS Imaging Performed on Focused Ion Beam - based Platforms.
| Autor: | Audinot, Jean-Nicolas, Ost, Alexander D., Stoffels, Charlotte, Philipp, Patrick, De Castro, Olivier, Biesemeier, Antje, Hoang, Quang Hung, Wirtz, Tom |
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| Zdroj: | Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p944-946, 3p |
| Databáze: | Complementary Index |
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