Opportunities and Challenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices.
| Autor: | Deitz, Julia I., Perry, Daniel L., Polonsky, Andrew T., Ruggles, Timothy J., Jungjohann, Katherine L., Harrison, Katharine L., McBrayer, Josefine D., Michael, Joseph R. |
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| Zdroj: | Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p884-886, 3p |
| Databáze: | Complementary Index |
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