Control of Transfer Characteristics of Atomic Layer Deposited Al-Doped SnO2 Thin Film through a Post-Annealing Process.

Autor: Kim, Byunguk, Park, Hyunwoo, Lee, Sungkwon, Lee, Dowwook, Jung, Chanwon, Jeon, Hyeongtag
Zdroj: ECS Journal of Solid State Science & Technology; May2022, Vol. 11 Issue 5, p121-127, 7p
Databáze: Complementary Index