| Autor: |
Lee, Wei Chuang, Sagehashi, Ryunosuke, Zhang, Yang, Popov, Alexey A., Muntwiler, Matthias, Greber, Thomas |
| Předmět: |
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| Zdroj: |
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Sep2022, Vol. 40 Issue 5, p1-3, 3p |
| Abstrakt: |
X-ray Absorption Spectroscopy (XAS) is used for measuring monolayer quantities of Ho 3 N@C 80 endofullerene molecules on graphene at a low flux bending magnet beamline. The total electron yield is measured with an Everhart–Thornley detector. In comparison to sample current measurements with the same noise level, our approach reduces data acquisition time and radiation dose by a factor of 25. As the first application of this setup, we report temperature-dependent measurements of the Ho M 45 edge with per mille accuracy. This documents the advantages and capabilities of an Everhart–Thornely detector for XAS measurements under low x-ray flux. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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