| Abstrakt: |
By the finite-difference time-domain method, we modeled the reflection coefficient with the ratios of the layer thicknesses of SiO2/TiO2. SiO2/TiO2 thin film thickness ratios that minimize the effective reflectance in the broadband of 400-800 nm were simulated using an artificial neural network. For the Si/SiO2/TiO2 system, the results were obtained with the following layer parameters: n(Si)= 3:7-5.6, n(TiO2) = 2:3-2.7, d(TiO2) = 25 nm, and n(SiO2) = 1:5, d(SiO2) = 24 nm. The average effective reflectance coefficient in the broadband of 400-800 nm was about 6.6%. Accordingly, the optimization of the thickness parameters of the anti-reflection film has shown that it is possible to significantly reduce the total effective reflectance in the visible range, thereby increasing the efficiency of the solar cells. [ABSTRACT FROM AUTHOR] |
